Applications
- Identify failure modes such as fatigue, stress cracking, and hydrogen embrittlement
- Identify and evaluate the crystalline structure of materials
- Evaluate and photograph surfaces, particles, defects, and structures at magnifications to 300,000X
- Measure the chemical composition of items being examined
Equipment Features
- Unique VP-mode allowing microscopy of wet, oily, and non-conductive samples without conventional sample preparation
- Resolution: 3.0nm High Vacuum Mode / 4.0nm Variable Pressure Mode
- Chamber accommodates 10 inch specimen
- Fully eucentric 5-axis computer controlled motorized stage
- Chemical analysis with Oxford Research X-Max Energy Dispersive Spectrometer (EDS)
Calibration
The microscope is calibrated and undergoes regular maintenance from Hitachi, ensuring the highest accuracy in all analyses.